DPS
Drejtoria e Përgjithshme e Standardizimit
Tel/Cel: +355 4 222 62 55
E-mail: info@dps.gov.al
Adresa: Rr.: "Reshit Collaku", (pranë ILDKPKI, kati VI), Kutia Postare 98, Tiranë - Shqipëri
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Projects

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Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices

60.60 Standard published

TC 47/SC 47F më tepër

Semiconductor devices - Micro-electromechanical devices - Part 45: Silicon based MEMS fabrication technology - Measurement method of impact resistance of nanostructures

60.60 Standard published

TC 47/SC 47F më tepër

Semiconductor devices - Micro-electromechanical devices - Part 46: Silicon based MEMS fabrication technology - Measurement method of tensile strength of nanoscale thickness membrane

60.60 Standard published

TC 47/SC 47F më tepër

Semiconductor devices - Micro-electromechanical devices - Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures

60.60 Standard published

TC 47/SC 47F më tepër

Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device

60.60 Standard published

TC 47/SC 47F më tepër

Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches

60.60 Standard published

TC 47/SC 47F më tepër

Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches

60.60 Standard published

TC 47/SC 47F më tepër

Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones

60.60 Standard published

TC 47/SC 47F më tepër

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials

60.60 Standard published

TC 47/SC 47F më tepër

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

60.60 Standard published

TC 47/SC 47F më tepër

Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films

60.60 Standard published

TC 47/SC 47F më tepër

Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS

60.60 Standard published

TC 47/SC 47F më tepër

Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS

60.60 Standard published

TC 47/SC 47F më tepër

Optical fibres - Reliability - Power law theory

60.60 Standard published

TC 86/SC 86A më tepër

Electricity metering - Glossary of terms

60.60 Standard published

TC 13 më tepër

Electricity metering - Data exchange for meter reading, tariff and load control - Glossary of terms - Part 1: Terms related to data exchange with metering equipment using DLMS/COSEM

60.60 Standard published

TC 13 më tepër

Corrigendum 1 - Electricity metering - Data exchange for meter reading, tariff and load control - Glossary of terms - Part 1: Terms related to data exchange with metering equipment using DLMS/COSEM

60.60 Standard published

TC 13 më tepër

Electricity metering equipment - General requirements, tests and test conditions - Part 11: Metering equipment

60.60 Standard published

TC 13 më tepër