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IEC 62899-202-11 ED1

Printed electronics - Part 202-11: Materials - Conductive ink - Measurement method of electrical resistance uniformity for large area printed conductive layers

General information

50.20     Feb 14, 2025

PRVD    Mar 28, 2025

IEC

TC 119

International Standard

31.180     87.080  

Scope

IEC 62899-202-11 ED1 specifies a measurement method of electrical resistance uniformity for large area printed conductive layers. The purpose of this method is to measure resistance uniformity of planar large area printed layers. This method cannot measure sheet resistance. The methods measure electrical resistance or electrical potential drop and use direct contact.

Life cycle

NOW

IN_DEVELOPMENT
IEC 62899-202-11 ED1
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Feb 14, 2025

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