IEC 62899-202-11:2025 ED1

Printed electronics - Part 202-11: Materials - Conductive ink - Measurement method of electrical resistance uniformity for large area printed conductive layer

Publication date: Apr 23, 2025

General information

Current stage: 60.60 Effective date: Apr 23, 2025

Originator: IEC

Owner: TC 119

Type: International Standard

ICS: 31.180 87.080

Languages: English

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Status: Published

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Scope

IEC 62899-202-11:2025 specifies a measurement method of electrical resistance uniformity for large area printed conductive layers. The purpose of this method is to measure resistance uniformity of planar large area printed layers. This method cannot measure sheet resistance. The methods measure electrical resistance or electrical potential drop and use direct contact.

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PUBLISHED
IEC 62899-202-11:2025 ED1
60.60 Standard published
Apr 23, 2025