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Nanomanufacturing - Key control characteristics - Part 6-3: Graphene-based material - Domain size: substrate oxidation
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-30: Graphene-based material - Anion concentration: Ion chromatography method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-4: Graphene-based materials - Surface conductance: non-contact microwave resonant cavity method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-5: Graphene-based materials - Contact and sheet resistance: transmission line measurement
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-7: Graphene - Sheet resistance: van der Pauw method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-8: Graphene - Sheet resistance: In-line four-point probe
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-9: Graphene-based material - Sheet resistance: Eddy current method
60.60 Standard published
Corrigendum 1 - Nanomanufacturing - Key control characteristics - Part 6-13: Graphene-based material - Oxygen functional group content: Boehm titration method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 7-2: Nano-enabled photovoltaics - Device evaluation method for indoor light
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices - Analogue resistance change and resistance fluctuation: Electrical resistance measurement
60.60 Standard published
Nanomanufacturing – Key control characteristics – Part 8-4: Metal-oxide interfacial devices – Activation energy of electronic trap states: Low-frequency-noise spectroscopy
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 9-2: Nanomagnetic products - Magnetic field distribution: Magneto-optical indicator film technique
60.60 Standard published
Multimedia home network configuration - Basic reference model - Part 1: System model
60.60 Standard published
Multimedia home network configuration - Basic reference model - Part 2: Operational model
60.60 Standard published
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