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Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
60.60 Standard published
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
60.60 Standard published
Industrial-process measurement, control and automation - Framework for functional safety and security
60.60 Standard published
Power supplying scheme for wearable system and equipment
60.60 Standard published
Dedicated radionuclide imaging devices - Characteristics and test conditions - Part 1: Cardiac SPECT
60.60 Standard published
Safety of machinery - Security aspects related to functional safety of safety-related control systems
60.60 Standard published
Railway applications - Rolling stock - Electrical equipment in trolley buses - Safety requirements and current collection systems
60.60 Standard published
Amendment 1 - Railway applications - Rolling stock - Electrical equipment in trolley buses - Safety requirements and current collection systems
60.60 Standard published
Good refurbishment practices for medical imaging equipment
60.60 Standard published
Installations for electroheating and electromagnetic processing - Test methods for induction through-heating installations
60.60 Standard published
Amendment 1 - Code of practice for hearing-loop systems (HLS)
60.60 Standard published
Amendment 2 - Code of practice for hearing-loop systems (HLS)
60.60 Standard published
Intelligent device management - Part 2: Requirements and recommendations
60.60 Standard published
Household and similar electrical air cleaning appliances - Methods for measuring the performance - Part 1: General requirements
60.60 Standard published
Household and similar electrical air cleaning appliances - Methods for measuring the performance - Part 1: General requirements
60.60 Standard published
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