ISO 18118:2024

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Publication date: 28 shk 2024

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Current stage: 60.60 Effective date: 28 shk 2024

Originator: ISO

Owner: ISO/TC 201/SC 7

Type: International Standard

ICS: 71.040.40

Gjuha: anglisht

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Statusi: Publikuar

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This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.

ISO 18118:2024

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

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