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ISO 13424:2013

Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
23 sht 2013

General information

90.93     17 qer 2021

ISO

ISO/TC 201/SC 7

International Standard

71.040.40  

anglisht  

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Scope

ISO 13424:2013 specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle-resolved XPS, XPS sputter-depth profiling, peak-shape analysis, and variable photon energy XPS.

Life cycle

NOW

PUBLISHED
ISO 13424:2013
90.93 Standard confirmed
17 qer 2021