ISO 13084:2011

Surface chemical analysis — Secondary-ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

Publication date: 5 maj 2011

95.99 Withdrawal of Standard 15 nën 2018

General information

Current stage: 95.99 Effective date: 15 nën 2018

Originator: ISO

Owner: ISO/TC 201/SC 6

Type: International Standard

ICS: 71.040.40

Gjuha: anglisht

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Statusi: Shfuqizuar

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ISO 13084:2011 specifies a method to optimize the mass calibration accuracy in time-of-flight SIMS instruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is not restricted to any particular instrument design. Guidance is provided for some of the instrumental parameters that can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scale for optimum mass accuracy.

ISO 13084:2011

Surface chemical analysis — Secondary-ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

95.99 Withdrawal of Standard 15 nën 2018

General information

Buying

Scope

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