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ISO 10810:2010

Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
16 nën 2010
95.99 Withdrawal of Standard   22 gush 2019

General information

95.99     22 gush 2019

ISO

ISO/TC 201/SC 7

International Standard

71.040.40  

anglisht   frëngjisht  

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Scope

ISO 10810:2010 is intended to aid the operators of X‑ray photoelectron spectrometers in their analysis of typical samples. It takes the operator through the analysis from the handling of the sample and the calibration and setting-up of the spectrometer to the acquisition of wide and narrow scans and also gives advice on quantification and on preparation of the final report.

Life cycle

NOW

WITHDRAWN
ISO 10810:2010
95.99 Withdrawal of Standard
22 gush 2019

REVISED BY

PUBLISHED
ISO 10810:2019