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ISO 24173:2009

Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
14 sht 2009
95.99 Withdrawal of Standard   9 shk 2024

General information

95.99     9 shk 2024

ISO

ISO/TC 202

International Standard

71.040.50  

anglisht   frëngjisht  

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Scope

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Life cycle

NOW

WITHDRAWN
ISO 24173:2009
95.99 Withdrawal of Standard
9 shk 2024

REVISED BY

PUBLISHED
ISO 24173:2024

National adoptions

SSH ISO 24173:2009  
DPS

Analiza mikrorreze -Udhëzime për matjen e orientimit duke përdorur shpërbërjen e rrezatimit të elektronit përmes një këndi prej 180 gradësh.

60.60 Standard published

DPS/KT 233 më tepër