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ISO 14706:2000

Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
21 dhj 2000
95.99 Withdrawal of Standard   25 korr 2014

General information

95.99     25 korr 2014

ISO

ISO/TC 201

International Standard

71.040.40  

anglisht  

Buying

Shfuqizuar

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Scope

Life cycle

NOW

WITHDRAWN
ISO 14706:2000
95.99 Withdrawal of Standard
25 korr 2014

REVISED BY

PUBLISHED
ISO 14706:2014