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IEC 62007-2:1997 ED1

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
26 shk 1999

General information

99.60     26 jan 2009

IEC

TC 86/SC 86C

International Standard

31.080.01     31.260     33.180.01  

anglisht   frëngjisht  

Buying

Revised

Language in which you want to receive the document.

Scope

Describes the measuring methods applicable to the semiconductor devices to be used in the field of fibre optic systems and subsystems.

Life cycle

NOW

WITHDRAWN
IEC 62007-2:1997 ED1
99.60 Withdrawal effective
26 jan 2009

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 62007-2:1997/AMD1:1998 ED1

ABANDON
IEC 62007-2/AMD2 ED1

REVISED BY

PUBLISHED
IEC 62007-2:2009 ED2