Revised
Covers a test method for the determination of the d.c. critical current of short and straight Ag- or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono- or multicores of oxides.
WITHDRAWN
IEC 61788-3:2000 ED1
99.60
Withdrawal effective
27 pri 2006
PUBLISHED
IEC 61788-3:2006 ED2