IEC 61163-2:1998 ED1

Reliability stress screening - Part 2: Electronic components

Publication date: 27 nën 1998

General information

Current stage: 99.60 Effective date: 11 mar 2020

Next stage: WPUB

Originator: IEC

Owner: TC 56

Type: International Standard

ICS: 03.120.01 31.020

Gjuha: anglisht frëngjisht spanjisht

Buying

Statusi: Revised

PDF - 28 268 Lekë

Paper - 28 268 Lekë

CD - 28 268 Lekë

Language

Language in which you want to receive the document.

Scope

Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60300-3-7:1999 ED1

NOW

WITHDRAWN
IEC 61163-2:1998 ED1
99.60 Withdrawal effective
11 mar 2020

REVISED BY

PUBLISHED
IEC 61163-2:2020 ED2