IEC 60747-5-3:1997 ED1

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Publication date: 5 sht 1997

General information

Current stage: 99.60 Effective date: 23 shk 2016

Originator: IEC

Owner: TC 47/SC 47E

Type: International Standard

ICS: 31.26

Gjuha: anglisht frëngjisht

Buying

Statusi: Replaced

PDF - 23 179 Lekë

Paper - 23 179 Lekë

CD - 23 179 Lekë

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Scope

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

Life cycle

PREVIOUSLY

Replaces
IEC 60747-5:1992/AMD1:1994 ED2

Replaces
IEC 60747-5:1992/AMD2:1995 ED2

Replaces
IEC 60747-5:1992 ED2

NOW

IEC 60747-5-3:1997 ED1
99.60 Withdrawal effective
23 shk 2016

CORRIGENDA / AMENDMENTS

Amended by
IEC 60747-5-3:1997/AMD1:2002 ED1

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