IEC 62435-2:2017 ED1

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

Publication date: 24 jan 2017

General information

Current stage: 60.60 Effective date: 24 jan 2017

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.020

Gjuha: anglisht frëngjisht

Buying

Statusi: Publikuar

PDF - 13 003 Lekë

Paper - 13 003 Lekë

CD - 13 003 Lekë

Language

Language in which you want to receive the document.

Scope

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

Life cycle

NOW

PUBLISHED
IEC 62435-2:2017 ED1
60.60 Standard published
24 jan 2017