IEC 60749-43:2017 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

Publication date: 15 qer 2017

General information

Current stage: 99.60 Effective date: 25 gush 2021

Next stage: WPUB

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht

Buying

Statusi: Replaced

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Scope

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Life cycle

NOW

WITHDRAWN
IEC 60749-43:2017 ED1
99.60 Withdrawal effective
25 gush 2021

REVISED BY

PUBLISHED
IEC 63287-1:2021 ED1