IEC 62878-1-1:2015 ED1

Device embedded substrate - Part 1-1: Generic specification - Test methods

Publication date: 20 maj 2015

General information

Current stage: 60.60 Effective date: 20 maj 2015

Originator: IEC

Owner: TC 91

Type: International Standard

ICS: 31.180 31.190

Gjuha: anglisht frëngjisht

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Statusi: Publikuar

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Scope

IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

Life cycle

NOW

PUBLISHED
IEC 62878-1-1:2015 ED1
60.60 Standard published
20 maj 2015

National adoptions

SSH IEC 62878-1-1:2015 ED1

DPS

Nënshtresa e integruar në pajisje - Pjesa 1-1: Specifikimi gjenerik - Metodat e provës

60.60 Standard published

DPS/KT 8 më tepër