IEC TS 62878-2-4:2015 ED1

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

Publication date: 27 mar 2015

General information

Current stage: 60.60 Effective date: 27 mar 2015

Originator: IEC

Owner: TC 91

Type: Technical Specification

ICS: 31.180 31.190

Gjuha: anglisht frëngjisht

Buying

Statusi: Publikuar

PDF - 28 268 Lekë

Paper - 28 268 Lekë

CD - 28 268 Lekë

Language

Language in which you want to receive the document.

Scope

IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

Life cycle

NOW

PUBLISHED
IEC TS 62878-2-4:2015 ED1
60.60 Standard published
27 mar 2015