Revised
IEC 61994-4-4:2010(E) specifies the terms and definitions for single crystal wafers applied for surface acoustic wave (SAW) devices representing the state of the art, which are intended for use in the standards and documents of IEC technical committee 49. This second edition cancels and replaces the first edition published in 2005. The main changes with respect to the previous edition are listed below:
- Terms and definitions are rearranged in accordance with the order of the alphabet.
- "reduced LN" is appended to terms and definitions.
- "reduced LT" is appended to terms and definitions.
- reduction process is appended to terms and definitions.
WITHDRAWN
IEC TS 61994-4-4:2005 ED1
WITHDRAWN
IEC TS 61994-4-4:2010 ED2
99.60
Withdrawal effective
16 nën 2018
PUBLISHED
IEC TS 61994-4-4:2018 ED3