Revised
IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.
WITHDRAWN
IEC 61788-15:2011 ED1
99.60
Withdrawal effective
23 mar 2026
PUBLISHED
IEC 61788-15:2026 ED2