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IEC 60747-14-1:2010 ED2

Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
21 jan 2010

General information

60.60     21 jan 2010

IEC

TC 47/SC 47E

International Standard

31.080.01  

anglisht   frëngjisht  

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Scope

IEC 60747-14-1:2009 describes general items concerning the specifications for sensors, which are the basis for specifications given in other parts of this series for various types of sensors. Sensors described in this standard are basically made of semiconductor materials, however, the statements made in this standard are also applicable to sensors using materials other than semiconductor, for example dielectric and ferroelectric materials. The major changes with regard to the previous edition are as follows: a) Title change from "Semiconductor sensors - General and classification" to "Semiconductor sensors - Generic specification for sensors"; b) Clause 3 has been divided into three Clauses 3, 4 and 5; c) Added new terms from IEC 60747-14-5; d) Added a new Clause relating to Quality assessment procedures; e) Added a Bibliography; f) Added a new Annex for the sampling procedure.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60747-14-1:2000 ED1

NOW

PUBLISHED
IEC 60747-14-1:2010 ED2
60.60 Standard published
21 jan 2010

National adoptions

Pajisje gjysëmpërçuese - Pjesa 14-1: Sensorë me gjysëmpërçues - Specifikime të përgjithshme për sensorët

60.60 Standard published

DPS/KT 7 më tepër