IEC PAS 62483:2006 ED1

Test method for measuring whisker growth on tin and tin alloy surface finishes

Publication date: 12 sht 2006

General information

Current stage: 99.60 Effective date: 25 sht 2013

Originator: IEC

Owner: TC 47

Type: Publicly Available Specification

ICS: 31.080.01

Gjuha: anglisht

Buying

Statusi: Replaced

PDF - 22 614 Lekë

Paper - 22 614 Lekë

CD - 22 614 Lekë

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Scope

Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document

Life cycle

NOW

WITHDRAWN
IEC PAS 62483:2006 ED1
99.60 Withdrawal effective
25 sht 2013

REVISED BY

PUBLISHED
IEC 62483:2013 ED1