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IEC 62415:2010 ED1

Semiconductor devices - Constant current electromigration test
19 maj 2010

General information

60.60     19 maj 2010

IEC

TC 47

International Standard

31.080.01  

anglisht   frëngjisht  

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IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

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PUBLISHED
IEC 62415:2010 ED1
60.60 Standard published
19 maj 2010