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IEC 62047-66 ED1

Semiconductor devices - Micro-electromechanical devices - Part 66: Test method for processing electrophysiological impedance data obtained from 3D cell-tissue models in MEMS chip array-based high-throughput screening systems

General information

20.99     30 tet 2026

CD    19 shk 2027

IEC

TC 47/SC 47F

International Standard

31.080.99  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-66 ED1
20.99 WD approved for registration as CD
30 tet 2026