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PNW 47F-569 ED1

Semiconductor devices - Micro-electromechanical devices - Part 66: Test method for processing electrophysiological impedance data obtained from 3D cell-tissue models in MEMS chip array-based high-throughput screening systems

General information

10.20     28 gush 2026

PRVN    23 tet 2026

IEC

TC 47/SC 47F

International Standard

Scope

Life cycle

NOW

IN_DEVELOPMENT
PNW 47F-569 ED1
10.20 New project ballot initiated
28 gush 2026