IEC 60191-6-16:2007 ED1

Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

Publication date: 26 pri 2007

General information

Current stage: 60.60 Effective date: 26 pri 2007

Originator: IEC

Owner: TC 47/SC 47D

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht

Buying

Statusi: Publikuar

PDF - 4 523 Lekë

Paper - 4 523 Lekë

CD - 4 523 Lekë

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Scope

IEC 60191-6-16:2007 gives a glossary of semiconductor sockets for BGA, LGA, FBGA and FLGA. This standard intends to establish definitions and unification of terminology relating to tests and burn-in sockets for BGA, LGA, FBGA and FLGA.

Life cycle

NOW

PUBLISHED
IEC 60191-6-16:2007 ED1
60.60 Standard published
26 pri 2007

REVISED BY

ABANDON
IEC 60191-6-16 ED2