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IEC 60749-7 ED3

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

General information

Current stage: 40.20 Effective date: 6 sht 2024

Next stage: PRVC Next stage date: 29 nën 2024

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Scope

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60749-7:2011 ED2

NOW

IN_DEVELOPMENT
IEC 60749-7 ED3
40.20 DIS ballot initiated: 12 weeks
6 sht 2024

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