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IEC 62047-54 ED1

Semiconductor devices - Micro-electromechanical devices - Part 54: Silicon based MEMS fabrication technology – Measurement method of tensile strength of microstructures

General information

40.99     30 tet 2026

DECFDIS    26 mar 2027

IEC

TC 47/SC 47F

International Standard

31.080.99  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-54 ED1
40.99 Full report circulated: DIS approved for registration as FDIS
30 tet 2026