Defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged.
This standard defines
- test voltage waveform;
- range of test levels;
- test generator;
- test set-up;
- test procedure.
This consolidated version consists of the first edition (1999)
and its amendment 1 (2001). Therefore, no need to order amendment in
addition to this publication.
PUBLISHED
IEC 61000-4-17:1999+AMD1:2001 CSV ED1.1
60.60
Standard published
8 korr 2002