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IEC 62047-52 ED1

Semiconductor Devices - Micro-electromechanical Devices - Part 52: Biaxial tensile testing method for stretchable MEMS

General information

30.99     15 nën 2024

TCDV    24 jan 2025

IEC

TC 47/SC 47F

International Standard

31.080.99  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-52 ED1
30.99 CD approved for registration as DIS
15 nën 2024