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IEC TR 63571:2025 ED1

Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
13 maj 2025

General information

60.60     13 maj 2025

IEC

TC 47

Technical Report

31.080.99  

anglisht  

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Scope

IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime. It presents a general mathematical theory and simple calculation examples for educational purposes. Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.

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PUBLISHED
IEC TR 63571:2025 ED1
60.60 Standard published
13 maj 2025