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IEC TS 62607-6-38 ED1

Nanomanufacturing - Key control characteristics - Part 6-38: Graphen- related products – Measurement of Schottky barrier heights of 2D material-based field-effect transistors

General information

20.99     14 qer 2024

CD    13 sht 2024

IEC

TC 113

Technical Specification

07.120  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC TS 62607-6-38 ED1
20.99 WD approved for registration as CD
14 qer 2024