IEC 60749-36:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Publication date: 13 shk 2003

General information

Current stage: 60.60 Effective date: 13 shk 2003

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

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Buying

Statusi: Publikuar

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Scope

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749:1996 ED2

WITHDRAWN
IEC 60749:1996/AMD1:2000 ED2

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2

NOW

PUBLISHED
IEC 60749-36:2003 ED1
60.60 Standard published
13 shk 2003