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IEC 63550-4 ED1

Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in neuromorphic memristor devices

General information

30.20     6 sht 2024

PCC    29 nën 2024

IEC

TC 47

International Standard

31.080.99  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 63550-4 ED1
30.20 CD study/ballot initiated
6 sht 2024

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