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IEC 63550-3 ED1

Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices

General information

50.00     24 sht 2026

CFDIS    17 dhj 2026

IEC

TC 47

International Standard

31.080.99  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 63550-3 ED1
50.00 Final text received or FDIS registered for formal approval
24 sht 2026