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IEC 60747-6 ED4

Semiconductor devices - Part 6: Discrete devices - Thyristors

General information

50.20     20 qer 2025

PRVD    1 gush 2025

IEC

TC 47/SC 47E

International Standard

31.080.20  

Scope

IEC 60747-6 ED4 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics (properties), measuring and test methods, requirements for type tests, routine tests, endurance tests and marking for the following discrete semiconductor devices:
- reverse blocking triode thyristors;
- reverse conducting (triode) thyristors;
- bidirectional triode thyristors (triacs);
- turn-off thyristors.
If no ambiguity is likely to result, any of the above will be referred to as thyristors.
This edition includes the following significant technical changes with respect to the previous edition:
a) the terms and definitions for partial thermal resistance junction-to-case and voltages related to ratings and characteristics (properties) have been added;
b) Clauses 3, 4, 5, 6 and 7 were amended with some deletions of information no longer in use and with some necessary additions.

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60747-6:2016 ED3

NOW

IN_DEVELOPMENT
IEC 60747-6 ED4
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
20 qer 2025

Preview

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