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IEC 60747-2 ED4

Semiconductor devices - Part 2: Discrete devices - Rectifier diodes

General information

50.20     20 qer 2025

PRVD    1 gush 2025

IEC

TC 47/SC 47E

International Standard

31.080.10  

Scope

IEC 60747-2 ED4 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics (properties), measuring and test methods, requirements for type tests, routine tests, endurance tests and marking for the following discrete semiconductor devices:
- generic rectifier diodes;
- avalanche rectifier diodes;
- fast-switching rectifier diodes;
- Schottky barrier diodes.
If no ambiguity is likely to result, any of the above will be referred to as diodes.
This edition includes the following significant technical changes with respect to the previous edition:
a) the terms and definitions for partial thermal resistance junction-to-case have been added;
b) Clauses 3, 4, 5, 6 and 7 have been amended with some deletions of information no longer in use and with some necessary additions.

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60747-2:2016 ED3

NOW

IN_DEVELOPMENT
IEC 60747-2 ED4
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
20 qer 2025

Preview

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