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IEC 60749-34-1 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module

General information

50.00     21 nën 2024

CFDIS    13 shk 2025

IEC

TC 47

International Standard

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 60749-34-1 ED1
50.00 Final text received or FDIS registered for formal approval
21 nën 2024