IEC PAS 62175:2000 ED1

Marking permanency test method

Publication date: 24 gush 2000

95.99 Withdrawal of Standard 1 korr 2002

General information

Current stage: 95.99 Effective date: 1 korr 2002

Originator: IEC

Owner: TC 47

Type: Publicly Available Specification

ICS: 31.080.01

Gjuha: anglisht

Buying

Statusi: Replaced

PDF - 2 261 Lekë

Paper - 2 261 Lekë

CD - 2 261 Lekë

Language

Language in which you want to receive the document.

Scope

Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.

Life cycle

NOW

WITHDRAWN
IEC PAS 62175:2000 ED1
95.99 Withdrawal of Standard
1 korr 2002

REVISED BY

WITHDRAWN
IEC 60749-9:2002 ED1