IEC TS 62876-4-1, which is a Technical Specification, establishes a general reliability testing programme to verify the reliability of the performance of quantum dots nanomaterials, and quantum dot enabled light conversion films (Q-LCFs).
The Q-LCF is used as subassemblies for the fabrication of nano-enabled photoelectrical display devices, mainly liquid crystal display (LCD) currently, with other components.
This testing programme defines standardized aging conditions, methodologies and data assessment for Q-LCF product.
The results of these tests define a stability under standardized aging conditions for quantitative evaluation of the reliability of the Q-LCF.
The procedures specified in this document were designed for Q-LCF but can be extended to serve as a guideline for other kinds of light conversion films or related subassemblies as well.
IN_DEVELOPMENT
IEC TS 62876-4-1 ED1
50.20
Proof sent to secretariat or FDIS ballot initiated: 8 weeks
4 tet 2024
Only informative sections of projects are publicly available. To view the full content, you will need to members of the committee. If you are a member, please log in to your account by clicking on the "Log in" button.
English