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IEC 62433-6:2020 ED1

EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)
22 sht 2020

General information

60.60     22 sht 2020

IEC

TC 47/SC 47A

International Standard

31.200  

anglisht   frëngjisht  

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Scope

IEC 62433-6:2020 describes the extraction flow for deriving an immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge (ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to IEC 61000-4-4.
The model addresses physical damages due to overvoltage, thermal damage and other failure modes. Functional failures can also be addressed. This model allows the immunity simulation of the IC in an application. This model is commonly called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI.
This document provides:
- the description of ICIM-CPI macro-model elements representing electrical, thermal or logical behaviour of the IC.
- a universal data exchange format based on XML.

Life cycle

NOW

PUBLISHED
IEC 62433-6:2020 ED1
60.60 Standard published
22 sht 2020

National adoptions

Modelimi i qarqeve të integruara për EMC-në - Pjesa 6: Modelet e qarqeve të integruara për simulimin e sjelljes së imunitetit ndaj impulseve - Modelimi i imunitetit ndaj impulseve të drejtuara (ICIM-CPI)

60.60 Standard published

DPS/KT 7 më tepër