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IEC TR 63258:2021 ED1

Nanotechnologies - A guideline for ellipsometry application to evaluate the thickness of nanoscale films
19 mar 2021

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60.60     19 mar 2021

IEC

TC 113

Technical Report

07.120  

anglisht  

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Scope

IEC TR 63258:2021 is a Technical Report focused on the practical protocol of ellipsometry to evaluate the thickness of nanoscale films. This document does not include any specification of the ellipsometers, but suggests how to minimize the data variation to improve data reproducibility.

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IEC TR 63258:2021 ED1
60.60 Standard published
19 mar 2021