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IEC 60147-2G:1975 ED1

Supplement G - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods - Chapter 4: Field-effect transistors
1 jan 1975

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99.60     19 nën 2016

IEC

TC 47

International Standard

31.080.10  

anglisht   frëngjisht   rusisht  

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WITHDRAWN
IEC 60147-2G:1975 ED1
99.60 Withdrawal effective
19 nën 2016

REVISED BY

WITHDRAWN
IEC 60747-8:1984 ED1