DS IEC TS 61945:2000 ED1

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

Publication date: Oct 29, 2021

General information

Current stage: 60.60 Effective date: Oct 29, 2021

Next stage: 95.99

Originator: DPS

Owner: DPS/KT 7

Type: Technical Specification

ICS: 31.2 31.200

Languages: English

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Status: Published

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Scope

Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.

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PUBLISHED
DS IEC TS 61945:2000 ED1
60.60 Standard published
Oct 29, 2021

Related project

Adopted from IEC TS 61945:2000 ED1 IDENTICAL

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