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DS IEC TS 61945:2000 ED1

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

Oct 29, 2021

General information

60.60     Oct 29, 2021

95.99   

DPS

DPS/KT 7

Technical Specification

31.2     31.200  

English  

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Scope

Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.

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PUBLISHED
DS IEC TS 61945:2000 ED1
60.60 Standard published
Oct 29, 2021

Related project

Adopted from IEC TS 61945:2000 ED1 IDENTICAL