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IEC TS 61945:2000 ED1

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

Mar 10, 2000

General information

60.60     Mar 10, 2000

IEC

TC 47/SC 47A

Technical Specification

31.2  

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Scope

Gives the methodology for technology and failure analysis in manufacturing integrated circuits.
Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.

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PUBLISHED
IEC TS 61945:2000 ED1
60.60 Standard published
Mar 10, 2000

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DS IEC TS 61945:2000 ED1  
DPS

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

60.60 Standard published

DPS/KT 7 more

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