Use the form below to find the searched projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”.
Fire hazard testing - Part 5-1: Corrosion damage effects of fire effluent - General guidance
60.55 Ratification completed (DOR)
Classification of environmental conditions - Part 3-6: Classification of groups of environmental parameters and their severities - Ship environments
40.20 DIS ballot initiated: 12 weeks
Automatic electrical controls - Part 1: General requirements
40.20 DIS ballot initiated: 12 weeks
Automatic electrical controls - Part 2-11: Particular requirements for energy regulators
40.20 DIS ballot initiated: 12 weeks
Automatic electrical controls - Part 2-13: Particular requirements for humidity sensing controls
40.20 DIS ballot initiated: 12 weeks
Automatic electrical controls - Part 2-14: Particular requirements for electric actuators
40.20 DIS ballot initiated: 12 weeks
Automatic electrical controls - Part 2-23: Particular requirements for electrical sensors and sensing elements
40.20 DIS ballot initiated: 12 weeks
Automatic electrical controls - Part 2-6: Particular requirements for automatic electrical pressure sensing controls including mechanical requirements
40.20 DIS ballot initiated: 12 weeks
Automatic electrical controls - Part 2-8: Particular requirements for electrically operated water valves, including mechanical requirements
40.20 DIS ballot initiated: 12 weeks
Automatic electrical controls - Part 2-5: Particular requirements for automatic electrical burner control systems
60.00 Standard under publication
Corrigendum 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
40.20 DIS ballot initiated: 12 weeks
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
40.20 DIS ballot initiated: 12 weeks
Semiconductor devices - Part 5-12: Optoelectronic devices - Light emitting diodes - Test method of LED efficiencies
40.20 DIS ballot initiated: 12 weeks
Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
40.20 DIS ballot initiated: 12 weeks
Semiconductor devices - Part 6: Discrete devices - Thyristors
40.20 DIS ballot initiated: 12 weeks
Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
40.20 DIS ballot initiated: 12 weeks
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
60.55 Ratification completed (DOR)
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
40.20 DIS ballot initiated: 12 weeks
Shqip