ISO 11505:2025

Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

Publication date: Jun 19, 2025

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Current stage: 60.60 Effective date: Jun 19, 2025

Originator: ISO

Owner: ISO/TC 201/SC 8

Type: International Standard

ICS: 71.040.40

Languages: English

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Status: Published

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This document specifies a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
The applicability of this document is limited to description of general procedures for quantification of the chemical composition and thickness in GD-OES compositional depth profiling. This document is not directly applicable for quantification of individual materials having various thicknesses and elements to be determined.

ISO 11505:2025

Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

General information

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