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ISO 11505:2012

Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

Dec 12, 2012
95.99 Withdrawal of Standard   Jun 19, 2025

General information

95.99     Jun 19, 2025

ISO

ISO/TC 201/SC 8

International Standard

71.040.40  

English  

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Scope

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

Life cycle

NOW

WITHDRAWN
ISO 11505:2012
95.99 Withdrawal of Standard
Jun 19, 2025

REVISED BY

PUBLISHED
ISO 11505:2025