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ISO 23833:2013

Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

Apr 5, 2013

General information

90.60     Dec 3, 2023

ISO

ISO/TC 202/SC 1

International Standard

01.040.71     71.040.99  

English   French  

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Scope

ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.
ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.

Life cycle

PREVIOUSLY

WITHDRAWN
ISO 23833:2006

NOW

PUBLISHED
ISO 23833:2013
90.60 Close of review
Dec 3, 2023

National adoptions

SSH ISO 23833:2013  
DPS

Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

60.60 Standard published

DPS/KT 233 more