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SSH ISO 23833:2013

Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

Nov 16, 2016

General information

60.60     Jul 12, 2016

DPS

DPS/KT 233

International Standard

01.040.71     71.040.99  

English  

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Scope

ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.
ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.

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PUBLISHED
SSH ISO 23833:2013
60.60 Standard published
Jul 12, 2016

Related project

Adopted from ISO 23833:2013