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ISO/TS 24597:2011

Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness

Jun 7, 2011

General information

90.93     Nov 18, 2023

ISO

ISO/TC 202/SC 4

Technical Specification

37.020  

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ISO/TS 24597:2011 specifies methods of evaluating the sharpness of digitized images generated by a scanning electron microscope by means of a Fourier transform method, a contrast-to-gradient method and a derivative method.

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ABANDON
ISO/DIS 24597

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PUBLISHED
ISO/TS 24597:2011
90.93 Standard confirmed
Nov 18, 2023

National adoptions

DS ISO/TS 24597:2011  
DPS

Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness

60.60 Standard published

DPS/KT 302 more